X-ray phase-contrast microscopy and microtomography
نویسندگان
چکیده
منابع مشابه
X-ray phase-contrast microscopy and microtomography.
In-line phase contrast enables weakly absorbing specimens to be imaged successfully with x-rays, and greatly enhances the visibility of fine scale structure in more strongly absorbing specimens. This type of phase contrast requires a spatially coherent beam, a condition that can be met by a microfocus x-ray source. We have developed an x-ray microscope, based on such a source, which is capable ...
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The first successful operation of an X-ray interferometer under conditions of non-planar three-beam diffraction for phase-contrast X-ray microtomography is reported. Intrinsic phase differences of the reflections used cancel from the three-dimensional phase image of the specimen. With simultaneous hkl and hkl reflections of a synchrotron radiation beam in a side-by-side geometry, the size of th...
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A phase-contrast X-ray microtomography system using the Talbot imaging has been built at the SPring-8 synchrotron radiation facility. This system has much higher density resolution than absorption-based X-ray microtomography. The tomographic sections of formalin-fixed mouse fetuses obtained with this method clearly depict various organs without any staining at a pixel resolution of up to 5 µm. ...
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A three-dimensional (3D) X-ray tomographic micro-imaging system has been developed. The optical system is based on a scanning-imaging X-ray microscope (SIXM) optics, which is a hybrid system consisting of a scanning microscope optics with a one-dimensional (1D) focusing (line-focusing) device and an imaging microscope optics with a 1D objective. In the SIXM system, each 1D dataset of a two-dime...
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We report the results of quantitative phase-contrast imaging experiments using synchrotron radiation, in-line imaging geometry and a non-interferometric phase retrieval technique. This quantitative imaging method is fast, simple, robust, does not require sophisticated x-ray optical elements and can potentially provide submicron spatial resolution over a field of view of the order of centimetres...
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ژورنال
عنوان ژورنال: Optics Express
سال: 2003
ISSN: 1094-4087
DOI: 10.1364/oe.11.002289